Thermal Testing of Integrated Circuits
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Thermal Testing of Integrated Circuits

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作者: Josep Altet  |  Antonio Rubio
出版年: 2002-6
页数: 224
定价: $ 213.57
ISBN: 9781402070761



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内容简介:

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

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